Publication date: 10 March 2026
然而，随着数据量的爆发增长，DRAM及NAND在耗电量及数据访问速度上依旧无法跟上需求的脚步。他们在需要高速运算的应用场景中也有一些阻碍。。关于这个话题，搜狗输入法2026提供了深入分析
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03:52, 28 февраля 2026Россия
Intel documentation describes the 386's Protection Test Unit as a component that "implements fast testing of complex memory protection functions." It is mostly composed of a PLA (Programmable Logic Array), referred to as Test PLA by Intel, that is physically visible by its regular appearance on the die. This single piece of combinational logic replaces what would otherwise be dozens of multi-cycle conditional branches in the microcode. Instead of testing privilege rules sequentially, the microcode issues a single protection test operation, and the PLA evaluates all applicable rules in parallel, producing a complete decision in one evaluation: continue, fault, or redirect to a gate handler.